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Maury Application Notes Library

Maury Application Notes Library

Download application notes relating to Maury products and Subjects of Interest

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Listed by Publication Date - Most Recent Dates First

2012

50 GHz Noise Parameter Measurements Using Agilent N5245A-series PNA-X with Noise Option 029

AUTHOR: Maury Microwave Corporation
PUBLICATION HISTORY: September 2012

ABSTRACT: The industry's most accurate mmW noise parameters can be obtained by combining Agilent Technologies' N5245Aseries PNA-X with Maury Microwaves MT984AU01 automated impedance tuner, MT7553B02 noise receiver module, and MT993-series ATS software suite. The turnkey solution is capable of measuring wideband noise parameters up to 50 GHz with improved speed and accuracy.

5C-088 + (869 KB)

Software Simplifies Stability Analysis

AUTHOR: Stephane Dellier, AMCAD Engineering
PUBLICATION HISTORY: First published in the August 2012 issue of the Microwaves & RF Magazine and republished in this form (with permission) in August 2012 by Maury Microwave Corporation.

ABSTRACT: This article, first appeared in print as the cover story in the August 2012 issue of Microwaves & RF magazine, and describes this new modeling tool for circuit design. It is must reading for designers who need a better understanding of the nature of the linear or smallsignal stability or the nonlinear or large-signal stability of circuits at an early point in the design process.

5A-054 + (4.01 MB)

Pulsed IV, Pulsed S-Parameters and Compact Transistor Models

AUTHORS: Steve Dudkiewicz, Maury Microwave Corporation
PUBLICATION HISTORY: First published in the April 2012 issue of the Microwave Journal and republished in this form (with permission) in April 2012 by Maury Microwave Corporation.

ABSTRACT: Microwave Journal Product Feature on BILT PUlsed IV system and IVCAD software for measuring Pulsed IV and Pulsed S-Parameters and extracting Compact Transistor Models

5A-053 + (0.53 MB)

Compact Transistor Models: The Roadmap to First-Pass Amplifier Design Success

AUTHOR: Tony Gasseling - General Manager, AMCAD Engineering
PUBLICATION HISTORY: First published in the March 2012 issue of the Microwave Journal and republished in this form (with permission) in March 2012 by Maury Microwave Corporation.

ABSTRACT: Compact transistor modeling extraction flow is presented, including: s-parameters to determine the extrinsic and intrinsic elements, Pulsed IV measurements used to extract the diode and current source model parameter under quasi-isothermal conditions, Pulsed S parameter measurements used to extract the nonlinear capacitance models that are needed for simulations in large signal operating conditions, electro-thermal and trapping effects, and modeling validation through frequency-domain and time-domain load pull measurements.

5A-052 + (0.66 MB)

2011

Active Load Pull Surpasses 500 Watts!

AUTHORS: Steve Dudkiewicz, Maury Microwave Corporation and Mauro Marchetti, Anteverta-mw
PUBLICATION HISTORY: Nov 2011

ABSTRACT: The MT2000 mixed-signal active load pull system breaks the 500W barrier with the successful characterization of a GEN8 NXP base station transistor.

5C-087 + (2.22 MB)

Vector-Receiver Load Pull Measurement

AUTHOR: Steve Dudkiewicz - Director, Device Characterization Business Development, Maury Microwave Corporation
PUBLICATION HISTORY: First published in the February 2011 issue of the Microwave Journal and republished in this form (with permission) in March 2011 by Maury Microwave Corporation.

ABSTRACT: Discusses the improvements in large-signal device characterization brought on by a new class of vector receiver load pull systems compared to older scalar techniques using calibrated automated load pull tuners.

5A-051 + (2.26 MB)

2010

Tracing The Evolution Of Load-Pull Methods

AUTHOR: Steve Dudkiewicz - Director, Device Characterization Business Development, Maury Microwave Corporation
PUBLICATION HISTORY: First published in the September 2010 issue of the Microwave Journal and republished in this form (with permission) in October 2010 by Maury Microwave Corporation.

ABSTRACT: Discusses how the evolution of load-pull tuning has led to hybrid and mixed-signal approaches that use the best features of mechanical and active tuners to speed measurements on nonlinear devices. Includes discussions of traditional passive mechanical tuner systems,harmonic load-pull techniques, active closed-loop load-pull methods, active open-loop load-pull systems, and the more recent hybrid load-pull and mixed-signal active load-pull approaches. Compares the relative merits and demerits of each approach and touches on the Maury MT2000 series Mixed-Signal Active Load-Pull systems as a advantageous solution.

5A-050 + (6.47 MB)

Mixed-signal Active Load Pull: The Fast Track to 3G and 4G Amplifiers

AUTHOR: Mauro Marchetti - Anteverta Microwave B.V., Delft, The Netherlands
PUBLICATION HISTORY: First published in the September 2010 issue of Microwaves and RF magazine and republished in this form (with permission) in October 2010 by Maury Microwave Corporation.

ABSTRACT: The current trend towards increased data rates in mobile services has direct implications for the power amplifiers operating in these systems. One response to this has been seen in the application of mixed-signal techniques to extend the capabilities of traditional active load-pull setups. This article presents a novel system that provides an unprecedented measurement speed, high dynamic range and is currently the only system that can handle communication standard compliant signals that are truly wideband, such as multicarrier W-CDMA. The ability to eliminate losses and electrical delay, while being completely free in defining the source and load reflection coefficients versus frequency, allows perfect mimicking of in-circuit situations, making the system a tool of fundamental importance for the RF power amplifier developer.

5A-049 + (2.7 MB)

Using Maury ATS Software to Extend the Agilent PNA-X to Active Load Pull - An Introduction to Active Load Pull

AUTHOR: Steve Dudkiewicz, Eng. - Maury Microwave Corporation
PUBLICATION HISTORY: May 2010

ABSTRACT: Active load pull has historically been a product offered in limited release and requiring heavy support. It has been of interest to educational institutions with limited appeal in industry. After decades of minimal activity, active load pull is being revitalized and commercialized by the teams at Maury Microwave and Agilent Technologies. Together, the companies offer user-friendly, commercially-viable active load pull and hybrid load pull solutions based on Agilent's PNA-X and Maury's proven ATS software.

5C-086 + (731 KB)

Using an Impedance Tuner and Noise Receiver Module to Extend the Agilent PNA-X to 50 GHz Noise Parameters

AUTHOR: Steve Dudkiewicz, Eng. - Maury Microwave Corporation
PUBLICATION HISTORY: May 2010

ABSTRACT: For the first time ever, designers can measure more accurate noise parameters in 1/100th the time to 50 GHz by combining Maury's revolutionary noise parameter measurement techniques with its MT7553B01 Noise Receiver Module, impedance tuners and the Agilent PNA-X.

5C-085 + (752 KB)

2009

Pulsed-Bias Pulsed-RF Harmonic Load Pull for Gallium Nitride (GaN) and Wide Band-Gap (WBG) Devices

AUTHOR: Steve Dudkiewicz, Eng. - Maury Microwave Corporation
PUBLICATION HISTORY: Originally presented by the author at a technical session of the 2nd International IEEE Conference on Microwaves, communications, Antennas and Electronic Systems (IEEE COMCAS 2009) 10 November 2009. Reprinted in this form with permission of IEEE November 2009.

ABSTRACT: For the first time ever, a commercially available pulsed-bias pulsed-RF harmonic load pull system is being offered for high power and wide band-gap devices. Pulsing DC bias in conjunction with pulsing RF reduces slow (long-term) memory effects by minimizing self-heating and trapping, giving a more realistic observance of transistor operating conditions. IV, S-Parameter and Load Pull measurements taken under pulsed-bias pulsed-RF conditions give more accurate and meaningful results for high-power pulsed applications.

5A-043 + (1011 KB)

Setting Up Load Pull With X-Parameters Using the Agilent NVNA

AUTHOR: Gary Simpson - Maury Microwave Corporation
PUBLICATION HISTORY: First published in June 2009.

ABSTRACT: This application note provides step-by-step instructions for setting up a test bench for load pull with X-parameter measurement using two Maury 98x series automated tuners, Maury ATS software version 5.1 (or newer) and the Agilent PNA-X test set to test a low-power DUT of a type suitable for direct connection to the PNA-X.

5C-083 + (791 KB)

Setting Up Ultra-Fast Noise Parameters Using the Agilent PNA-X

AUTHOR: Gary Simpson - Maury Microwave Corporation
PUBLICATION HISTORY: First published in June 2009.

ABSTRACT: This application note provides step-by-step instructions for setting up a test bench for ultra-fast noise parameter measurement using a Maury 98x series automated tuner, Maury ATS software version 5.1 with the MT993B01 Ultra-Fast Noise Parameter Option, and the Agilent PNA-X network analyzer.

5C-084 + (520 KB)

Using Impedance Tuners to Extend the Agilent 8960 Beyond 50Ω

AUTHOR: Steve Dudkiewicz - Maury Microwave Corporations
PUBLICATION HISTORY: First published in May 2009.

ABSTRACT: Mobile phones must guarantee proper functioning in non-ideal real-world environments, such as a lost or damaged antenna, usage in a tunnel or locker, being held close to the body or in a pocket surrounded by coins, etc. Each of these scenarios can be regarded as non-ideal from an RF standpoint, meaning non-50 ohm. We are able to use a single tuner to vary the VSWR magnitude and phase seen by the antenna port of the phone and test its performance in transmit and receive mode.

5C-080A + (2.3 MB)

Load Pull + NVNA = Enhanced X-Parameters for PA Designs with High Mismatch and Technology-Independent Large-signal Device Models

AUTHORS: Gary Simpson - Maury Microwave Corporation with Jason Horn, Dan Gunyan, David E. Root - Agilent Technologies, Santa Rosa.
PUBLICATION HISTORY: First published in December 2008 as a Technical Paper presented to the 72nd IEEE ARFTG Microwave Measurement Conference; Republished in this format by Maury Microwave Corporation in March 2009, with permission.

ABSTRACT: X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions. This work presents an automated application combining a Nonlinear Vector Network Analyzer (NVNA) instrument with automated load-pull measurements that extends the measurement and extraction of X-parameters over the entire Smith Chart. The augmented X-parameter data include magnitude and phase as nonlinear functions of power, bias, and load, at each harmonic generated by the device and measured by the NVNA. The X-parameters can be immediately used in a nonlinear simulator for complex microwave circuit analysis and design. This capability extends the applicability of measurement-based X-parameters to highly mismatched environments, such as high-power and multi-stage amplifiers, and power transistors designed to work far from 50 ohms. It provides a powerful and general technology-independent alternative, with improved accuracy and speed, to traditional large-signal device models which are typically slow to develop and typically extrapolate large-signal operation from small-signal and DC measurements.

5A-041 + (824 KB)

A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy

AUTHORS: Gary Simpson and Amar Ganwani - Maury Microwave Corporation with David Ballo and Joel Dunsmore - Agilent Technologies, Santa Rosa.
PUBLICATION HISTORY: First published in December 2008 as a Technical Paper presented to the 72nd IEEE ARFTG Microwave Measurement Conference (Was voted "Best Conference Oral Presentation" by the attendees); Republished in this format by Maury Microwave Corporation in March 2009, with permission.

ABSTRACT: A new method for noise parameter measurements is introduced, with better than 100x speed improvement over traditional methods. The setup is simple and easy to configure, and the entire calibration and measurement process is very fast, making dense frequency spacing practical. The new method produces smoother data with lower scatter, and the dense frequency spacing eliminates shifts due to aliasing and makes it easier to identify the scatter and outliers.

5A-042 + (902 KB)

Cascading Tuners For High-VSWR And Harmonic Load Pull

AUTHORS: Steve Dudkiewicz and Roman Meierer - Maury Microwave Corporation
PUBLICATION HISTORY: First published in January 2009.

ABSTRACT: For the first time ever, two or three tuners can be cascaded externally to achieve extremely high magnitudes of reflection (VSWR in the order of 100:1-200:1, £F>0.98) as well as control multiple impedances at multiple frequencies (wideband harmonic tuning). Due to the use of calibrated and interpolated data for all tuners, we are able to achieve an overall system-level accuracy of greater than 40-80dB at highest £F's.

5C-081 + (832.3 KB)

2008

Impedance Testing For Mobile Phones

AUTHOR: Steve Dudkiewicz - Maury Microwave Corporation
PUBLICATION HISTORY: First published in December 2008.

ABSTRACT: Load Pull is an invaluable tool for the mobile phone community, helping to design more robust and efficient products and guarantee their successful functionality in real-world environments. Mobile phones and their subcomponents can be tested in various stages: the internal power amplifier (PA), the front-end module (FEM), or the phone in its entirety. Maury MT993 ATS software is used to test PAs and FEMs for dozens of parameters including Power, Gain, Efficiency, Harmonic Power, Intermodulation Distortion (IMD), Error-Vector Magnitude (EVM), Adjacent Channel Power Ratio (ACPR), etc. Maury MT910 series software is a standalone application designed specifically for the testing of mobile phones in transmit and receive modes, for output power and sensitivity respectively, as a function of VSWR magnitude and phase.

5C-080 + (421 KB)

2006

Verifying VNA Source Match Using Coaxial Offset Shorts

AUTHOR: Bill Pastori - Maury Microwave Corporation
PUBLICATION HISTORY: First published in March 1990; Revised and republished in July 1999 and February 2006.

ABSTRACT: This application note describes a method of evaluating effective source match in coaxial measurement systems using just a long offset short.

5C-027 249 KB)

Verifying the Performance of Vector Network Analyzers

AUTHOR: Mario A. Maury, Jr., MSEE - Maury Microwave Corporation
PUBLICATION HISTORY: First published in July 1989; revised and republished in July 1999 and February 2006.

ABSTRACT: This application note describes procedures that can be used to verify the performance and operation of a Vector Network Analyzer (VNA) using just the equipment available in a standard Maury precision calibration kit. The purpose is to provide the user with a level of confidence in the accuracy of the VNA system. This information is applicable to all commercially available analyzers and is independent of the type of calibration employed.

5C-026 + (328 KB)

2005

Over-Temperature Noise Modeling of Submicron Devices Brought the Question: Is the Diffusion Coefficient Temperature Dependent?

AUTHOR: Ali Boudiaf, PhD - Maury Microwave Corporation
PUBLICATION HISTORY: First published in March 2005.

ABSTRACT: A new procedure is presented for modeling the variations on the temperature of the noise source coefficients related to the gate and the drain of a field effect transistor (FET).

5C-072 + (393 KB)

Signal Characterization and Modulation Theory

AUTHOR: John Sevic, MSEE; Maury Microwave Corporation.
PUBLICATION HISTORY: This paper first appeared as Chapter 3.3 in The RF and Microwave Handbook, Series: Electrical Engineering Handbook; Volume 22, by Mike Golio - Motorola, Tempe, Arizona, USA; Publisher: CRC Press,12/20/2000; ISBN: 084938592X (available on line at: http://www.crcpress.com/shopping_cart/products/product_contents.asp?id=&parent_id=&sku=8592&pc). Reprinted by permission in March 2005.

ABSTRACT: Contemporary microwave circuit design requires a basic understanding of digital modulation theory in order to meet the needs of a customer who ultimately speaks in terms of communication theory. This paper provides a brief overview of the signal analysis tools necessary for the microwave engineer to understand digital modulation and how it impacts the design and characterization of microwave circuits used in contemporary wireless communication systems. Complex envelope analysis is introduced as a means of describing arbitrarily modulated signals, leading to a geometric interpretation of modulation. The necessity and subsequent implications of band-limiting PSK signals is discussed. As an alternative to PSK, CPM is also introduced. Signal analysis methods are often used to simplify the design process. Although the peak-to-average ratio of a signal is widely used to estimate the linearity requirements of a PA, it is shown that this metric is ill-suited in general for this purpose due to the random distribution of instantaneous power of a signal. The envelope distribution function (EDF) is introduced as a means of comparing various signals and to provide a more accurate estimate of the required linearity performance of a PA.

5C-057 + (338 KB)

Tuner Instantaneous Bandwidth, Linear Network Distortion, and Intermodulation and ACPR Loadpull Characterization

AUTHORS: John Sevic, MSEE and Richard N. Wallace - Maury Microwave Corporation.
PUBLICATION HISTORY: First published in March 2005.

ABSTRACT: This application note illustrates how a linear network can induce asymmetry in intermodulation mixing products as a consequence of nonlinear phase response with respect to frequency. This effect, due to a non constant group delay over the modulation bandwidth, is often referred to as linear distortion. A method is described for characterizing Maury's ATS tuners to quantify their instantaneous bandwidth, resulting in identification of a maximum modulation bandwidth. It is shown that in most circumstances, Maury tuners are transparent at modulation bandwidths suitable for wideband applications such as 3GPP and 802.11x. Guidelines are also provided to minimize the induced asymmetry of linear networks commonly used in loadpull, such as bias networks and fixture networks.

5C-063 + (237 KB)

Measuring True PAE Using A Maury Automated Tuner System

AUTHORS: John Sevic, MSEE, and Ray Qin; Maury Microwave Corporation.
PUBLICATION HISTORY: First published in March 2005.

ABSTRACT: This application note discusses the theory behind the measurement of true Power Added Efficiency (PAE) and shows how to configure Agilent 8753x and 8510x series of VNAs for true PAE characterization. A plot is also given showing the error introduced by assuming transducer gain and power gain are equal, which is what loadpull systems provided by other manufacturers assume.

5C-065 + (230 KB)

Power, Transducer, Available and Insertion Gains Defined

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in March 2005.

ABSTRACT: A convenient reference sheet of equations that define Power Gain, Transducer Gain, Available Gain, and Insertion Gain.

5D-003A + (47 KB)

Characterization of Nonlinearity Using a Loadpull System

AUTHOR: John Sevic, MSEE - Maury Microwave Corporation.
PUBLICATION HISTORY: First published in March 2005.

ABSTRACT: This application note discusses the basics of load pull configuration and verification for optimum nonlinear load pull analysis of intermodulation and ACPR.

5C-061 + (170 KB)

2004

Specifying Source-Tuner Terminating Impedance With Maury ATS

AUTHOR: John Sevic, MSEE - Maury Microwave Corporation November 2004.
PUBLICATION HISTORY: First published in November 2004.

ABSTRACT: The source impedance presented at the DUT reference-plane by the source-tuner is a function of the source-tuner and its terminating impedance. The terminating impedance is based on the interaction of several signal conditioning elements, such as a bias tee, a coupler, a low-pass filter, and a reference PA. How the effect of this impedance is compensated for within ATS may have a deleterious effect on the accuracy of the source impedance displayed at the DUT reference-plane. This application note describes the various methods in which Maury ATS will compensate for this impedance.

5C-058 + (413 KB)

Basic Verification of Power Loadpull Systems

AUTHOR: John Sevic, MSEE - Maury Microwave Corporation.
PUBLICATION HISTORY: First published in October 2004.

ABSTRACT: A discussion of loadpull system verification using Maury ATS tuners, including a rigorous method of verifying loadpull calibration for power applications. Two examples of Delta_Gt verification are presented and compared. Also covered are common sources of error in Loadpull, and quantifying and controlling error in loadpull.

5C-055 + (413 KB)

Comparison of Harmonic Tuning Methods for Load Pull Systems

AUTHOR: Gary Simpson, MSEE - Maury Microwave Corporation.
PUBLICATION HISTORY: First published in February 2004.

ABSTRACT: A discussion of three methods of harmonic tuning that have been offered commercially for load pull systems with passive automated tuners. The relative advantages and disadvantages of each are examined and compared.

5C-053 + (497 KB)

Introduction to Tuner-Based Measurement and Characterization

AUTHOR: John Sevic, MSEE - Maury Microwave Corporation.
PUBLICATION HISTORY: First published in February 2004.

ABSTRACT: A discussion of tuner-based RF device characterization and measurement. A rational for automated tuner-based measurement and automated tuner-based device characterization is given, followed by a discussion of the factors that drive the choice of tuner architecture. These factors include repeatability, impedance range, tuner speed, power capability, tuner resolution, bandwidth, and the size, level of integration, and ease of integration that are characteristics of various automated tuners. Detailed explanations of how tuners synthesize impedance, when and how tuner resolution is important, and why tuner repeatability is critical, are also given. System configuration examples are given and discussion of advanced capabilities of automated tuner-based measurements is included. A glossary of terms related to these subjects is provided.

5C-054 + (139 KB)

2003

A Calibration Procedure for On-Wafer Differential Load-Pull Measurements

AUTHORS: M. Spirito; M. P. van der Heijden; M. de Kok; L. C. N. de Vreede - Laboratory of Electronic Components, Technology & Materials, KIMES, Delft University of Technology, The Netherlands.
PUBLICATION HISTORY: Reprinted with permission in November 2003 from the 61st ARFTG Conference Digest, Measurement Accuracy, Philadelphia, Pennsylvania; June 13, 2003.

ABSTRACT: This paper presents a calibration technique for on-wafer differential load-pull measurements. The described calibration procedure makes use of a standard GS/SG calibration substrate only. The calibration accuracy achieved is verified through various independent standard measurements.

5A-037 + (253 KB)

2002

A Sub 1Ω Load-Pull Quarter-Wave Prematching Network Based on a Two-Tier TRL Calibration

AUTHOR: John F. Sevic - Spectrian Corporation, Sunnyvale, California
PUBLICATION HISTORY: First published in the Microwave Journal, March 1999, Vol. 43, No. 3 and republished with permission in this format in December 2002.

ABSTRACT: Transistors used for cellular and PCS infrastructure applications are required to amplify signals with a peak-to-average ratio that can exceed 13 dB, resulting in a peak envelope power (PEP) approaching 1 kW. This PEP requirement is a consequence of simultaneous amplification of multiple digitally modulated carriers with a time-varying envelope and requires a load resistance in the neighborhood of 0.3Ω. Present load-pull technology based on mechanical tuners is limited to approximately 1Ω at cellular and PCS frequencies, which renders these systems incapable of characterizing transistors under these conditions. Quarter-wave prematching networks nave been developed to transform the source- and load-pull domains to a lower impedance. A variety of techniques have been used to characterize these quarter-wave networks, including standard vector network analyzer (VNA) error correction. This article presents a further refinement of this characterization technique, which is based on a two-tier calibration using 7mm and microstrip thru-reflect-line (TRL) calibrations.

5A-036 + (76 KB)

2000

Device Characterization with Harmonic Source and Load Pull

AUTHOR: Gary Simpson - Maury Microwave Corporation
PUBLICATION HISTORY: First published as an ATS training aid in June 1997; Revised and reprinted in this format in December 2000.

ABSTRACT: Automated source and load pull is widely used in power amplifier development to determine device capability and matching network requirements. Recently, harmonic load pull has become increasingly important, especially for optimizing efficiency and linearity. Harmonic source pull is also very significant for optimizing performance. Measured data shows that harmonic source tuning can sometimes have as big or bigger effect than the harmonic load tuning. When performance is critical, harmonic source tuning should be part of the process. This paper also discussed how the tuning range of passive tuner systems can be extended with prematching or with active tuners.

5C-044 + (31 KB)

Automated Large-Signal Load-Pull Characterization of Adjacent-Channel Power Ratio for Digital Wireless Communication Systems

AUTHORS: John Sevic, MSEE, Robert Baeten, Gary R. Simpson and Michael B. Steer.
PUBLICATION HISTORY: First published in the 46th ARFTG Conference Digest; Fall 1995, and reprinted by permission in this format with revisions September 2000.

ABSTRACT: Large-signal adjacent-channel power ratio load-pull contours of a GaAs MESFET and a GaAs MEMT excited by p/4-DQPSK modulation are demonstrated for the first time using an automated load-pull system. It is shown that in general there is only a weak relationship between two-tone third-order intermodulation and adjacent-channel power ratio for the (Japanese) Personal Digital Cellular standard.

5C-047 + (203 KB)

Source Match (dB) vs. Peak-to-Peak Ripple

AUTHOR: Maury Microwave Corporation - Engineering Department
PUBLICATION HISTORY: First published in July 2000.

ABSTRACT: A graph of tabular data correlating source match (dB) with peak-to-peak ripple (dB). A handy reference for determining the reliability of VNA calibrations.

5D-025 + (32 KB)

Importance of 2nd Harmonic Tuning for PA Design

AUTHORS: Gary R. Simpson - Maury Microwave Corporation, Ontario, California and Michael B. Steer - Motorola RFSD, Phoenix, Arizona.
PUBLICATION HISTORY: First published in the 48th ARFTG Conference Digest; December 1996, and reprinted by permission in this format in March 2000.

ABSTRACT: Load pull measurements are widely used to determine matching impedances required for optimum power amplifier design. In the past, this has typically been done at the fundamental frequency only. However, the harmonic terminations can have a significant effect. This paper presents some typical data which indicates the importance of second harmonic tuning to the power amplifier
designer.

5C-045 + (203 KB)

1999

Theory of Load and Source Pull Measurement

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in July 1999.

ABSTRACT: A brief discussion of the basics of load and source pull measurements.

5C-041 + (31 KB)

Theory of Noise Measurement

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in July 1999.

ABSTRACT: A brief discussion of the basics of noise measurements.

5C-042 + (85 KB)

Theory of Intermodulation Distortion Measurement

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in July 1999.

ABSTRACT: A brief discussion of the basics of Intermodulation distortion measurements.

5C-043 + (246 KB)

Tuner Repeatability: Fact and Fiction

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in June 1999.

ABSTRACT: Defines repeatability and discusses the repeatability specifications role in, determining how accurately and reliably a given tuner will perform. Knowledge of a tuner worst-case total repeatability specifications for all positions (and over its full frequency range) is vital in determining how that tuner will perform.

5C-032 + (73 KB)

1998

Measurement of Large-Signal Device Input Impedance during Load Pull

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in November 1998.

ABSTRACT: Describes a technique for directly measuring large-signal device input impedance on a load or source pull test while using a vector network analyzer.

5C-029 + (199 KB)

Fixture Characterization and S-Parameter Measurement Using Maury MT956D Software

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in May 1998.

ABSTRACT: Explains how to expand and simplify VNA generated s-parameter measurements using an inexpensive personal computer and Maury's MT956D software package.

5C-038 + (246 KB)

Handy Microwave Equations

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in January 1998.

ABSTRACT: A convenient reference sheet of equations commonly used in various microwave engineering applications. Equations shown here include Return Loss, Source Match, Peak-to-Peak Ripple in dB, Outer Conductor Diameter, Mismatch Loss, and others.

5D-003 + (33 KB)

1997

LRL Calibration of Vector Network Analyzers

AUTHORS: Mario A. Maury, Jr., Steven L. March and Gary R. Simpson - Maury Microwave Corporation, Ontario, California.
PUBLICATION HISTORY: First published in the Microwave Journal; Vol. 30, No.5 - May 1987. Reprinted by permission, with revisions in November 1997.

ABSTRACT: Compares certain vector network analyzer calibration methods: OSL (open-short-load), TSD (thru-short-delay), TRL (thru-reflect-line).

5A-017 + (302 KB)

VSWR vs. Return Loss

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in July 1997.

ABSTRACT: A two-page table that shows return loss associated with various VSWR values.

5D-011 + (20 KB)

Frequency-to-Wavelength Conversion Nomograph

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in July 1997.

ABSTRACT: A convenient reference for converting frequency to wavelength in nomograph format.

5D-015 + (33 KB)

Data-based Load Pull Simulations for Large-Signal Transistor Model Validation

AUTHORS: John F. Sevic - QUALCOMM, Incorporated, San Diego, California; Chuck McGuire - Hewlett-Packard Company, Westlake Village, California; Gary R. Simpson - Maury Microwave Corporation, Ontario, California; Jaime Pla - Motorola Incorporated, Phoenix, Arizona.
PUBLICATION HISTORY: First published in Microwave Journal; Vol. 40, No. 3 - March 1997; republished in this format with permission in June 1997.

ABSTRACT: A new method for large-signal transistor model validation is described. Previous methods of large-signal model validation were performed without incorporating the effect of harmonic termination. The proposed method couples a harmonic-balance engine with measured automated load-pull system S-parameter data at fundamental and harmonic frequencies. The load states are synchronized properly so that the transistor model is loaded in the simulation exactly as it is during load-pull characterization. Measured vs. simulated results for a 1mm GaAs MESFET at 2 GHz are presented.

5A-027 + (213 KB)

1991

Applications of Maury Noise Calibrations

AUTHOR: Maury Microwave Corporation - Engineering Department.
PUBLICATION HISTORY: First published in February 1991.

ABSTRACT: Details the use of Maury noise calibration systems as highly accurate and reliable sources of RF and microwave noise, and as calibration standards for other noise generators.

5C-028 + (2.3 MB)