Experience Advanced Device Characterization in Action
November 3, 2026
November 4, 2026
California dates and times still to come.
Get hands-on with advanced RF and microwave device characterization solutions during the Maury Microwave November Roadshow. See live demonstrations covering harmonic load pull, Pulsed IV measurements, and wideband active load pull, and talk directly with Maury specialists about your device characterization challenges.
Learn more about Maury solutions
VNA-Based Harmonic Load Pull
Evaluate the impact of harmonic terminations on nonlinear device performance, efficiency, and linearity. Control fundamental and harmonic impedances to better understand device performance under different loading conditions and support PA design and optimization.
- 5–67 GHz frequency coverage
- Fundamental, 2nd, and 3rd harmonic impedance control
- Integrated coupler for reduced insertion loss
- Direct probe-tip connection for minimized loss
Pulsed IV Measurements
Capture device behavior under controlled pulsed bias conditions while minimizing self-heating and investigating trapping effects. Apply precisely controlled gate and drain pulses to examine device characteristics under different bias conditions and gain greater insight into intrinsic device behavior.
- Drain pulsing up to 280 V / 40 A
- Gate pulsing up to ±30 V / ±1.5 A
- Pulse widths down to 200 ns
- 10 ns timing resolution
MT2000 Mixed-Signal Active Load Pull
Measure device performance using wideband modulated and pulsed RF signals across a range of impedance conditions. Recreate complex RF operating conditions with precise impedance control to evaluate device performance under wideband, modulated, and pulsed test scenarios.
- Up to 67 GHz frequency coverage
- 2000 MHz bandwidth for wideband impedance control
- Up to 1,000 impedance/power states per minute
- Single-tone, double pulse, two-tone, and modulated signal load pull
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InsightPro brings advanced device characterization workflows together in one software environment, streamlining measurement setup, calibration, automation, visualization, analysis, impedance control, and modeling.
