EuMW 2026

Maury at EuMW 2026

October 4 - 9, 2026

London, UK

Booth #B30

Join Maury Microwave at EuMW 2026, October 4–9 in London, where we’ll showcase solutions designed to keep pace with today’s toughest RF and microwave test challenges.

Visit Booth #B30 during the exhibition for live demonstrations and featured solutions covering:

  • From Device Characterization to PA Optimization: InsightPro for Advanced Load Pull

  • Improving Model Accuracy with Advanced Pulsed IV Measurements

  • Enabling 5G/6G PA Design with Double RF Pulse & Wideband Load Pull

  • Accelerating D-Band Component Development with VRLP Active Load Pull

  • Validating 5G NTN Performance Through Realistic Satellite Link Emulation

  • Accelerating VNA Calibration and Improving Measurement Integrity

  • Electronic Warfare and Counter-UAS Testing with Broadband Noise Generation

  • End-to-End RF Solutions for EMC Immunity Testing

  • Higher Reliability RF Power: Solid-State Alternatives to Traveling Wave Tubes

Experience these technologies firsthand at EuMW 2026.

Schedule a Meeting with the Maury Team

Meet with the Maury team at Booth #B30 to discuss your application requirements.

Product Demonstrations

Demos Addressing Your Most Challenging Requirements

Broadband, Solid-State Power Amplifiers

D-Band VRLP Active Load Pull

Advanced Satellite Link Emulation for 5G NTN

Noise Solutions for EW and Counter-UAS

Product Demonstrations

Read our EuMW 2026 Demonstration Guides

Product Demonstrations

EuMW 2026 Demonstration Booklet - All Maury Demos in One Place

Maury Microwave is bringing best-in-class technologies to Booth B30 at EuMW 2026 in London, featuring live demonstrations of advanced load pull, pulsed IV measurements, satellite link emulation, VNA calibration, EMC immunity, counter-UAS testing, and real-time RF power measurement.

Download the EuMW 2026 product demonstration booklet to learn about each and every demo at the Maury booth.

EuMW 2026 Short Course

SS02 EuMIC: Fundamentals of Microwave PA Design

Sunday, October 4, 2026

08:30 – 18:30

Room 7

Explore the fundamentals and latest advances in semiconductor microwave power amplifier design, including device technologies, load pull techniques, advanced amplifier architectures, stability, linearity, and linearization.

FEATURED TALK DURING short course

Design and model-oriented Load Pull techniques: from basic CW to wideband and double pulsed Load Pull systems

Gustavo Avolio, Maury Microwave

EuMW 2026 Workshop

WS08 EuMC: Advances in AI-Driven Microwave Design: From devices up to system-level

Sunday, October 4, 2026

08:30 – 18:30

Room 12

This workshop covers how AI and machine learning are transforming microwave design, from data-driven device modeling and electromagnetic optimization to circuit, subsystem, and system-level design.

FEATURED TALK DURING WORKSHOP

Loadpull data into Circuit Simulator Using Artificial Neural Networks

Gustavo Avolio, Maury Microwave

EuMW 2026 Workshop

SM02 EuMC: Harnessing Phase Information to Improve RF Measurements

Monday, October 5, 2026

14:10 – 18:30

Room 2

Learn the use of amplitude and phase information to improve RF and microwave measurement accuracy, with a focus on phase references, traceable calibration, measurement uncertainty, and modern test and measurement techniques.

FEATURED TALK DURING WORKSHOP

Behavioral Modeling via Time Domain Signal Analysis

Mauro Marchetti, Maury Microwave

EuMW 2026 Workshop

WM06 EuMC/EuMIC: Enabling Ultra-Low Noise RF Systems: Technology, Materials and Metrology

Monday, October 5, 2026

08:30 – 18:30

Room 15

Learn about advances in ultra-low-noise RF systems, including semiconductor technologies, noise measurement challenges, and emerging metrology techniques for microwave and millimeter-wave applications.

FEATURED TALK DURING WORKSHOP

Advancements in Noise Parameters Characterization: from Room-Temperature to cryogenic applications

Mauro Marchetti, Maury Microwave

EuMW 2026 Workshop

EuMC36: Advanced Characterization of RF Devices and Systems

Wednesday, October 7, 2026

16:50–18:30

Room 14

This session covers advanced techniques for characterizing RF devices and systems, including vector network analysis, near-field measurements, high-power RF characterization, and noise parameter measurements at controlled and cryogenic temperatures.

Session Chair: Mauro Marchetti, Maury Microwave

Request a Demo