Software
InsightPro Measurement and Modeling Device Characterization Software
InsightPro™ is the industry’s premier unified software suite, designed to accelerate the component and sub-system measurement and model extraction workflow for R&D, design verification, and small-scale production testing.
Built with a measurement-first approach, InsightPro™ serves as the primary software interface for instrument-agnostic small-signal and large-signal characterization in both 50Ω and non-50Ω environments. By streamlining data collection, management, and analysis, it enables engineers and researchers to make informed decisions with confidence.
Maury Microwave
Features and Benefits
- Flexible bench configuration empowers users to easily set up instruments and DUTs to match any measurement workflow.
- Automated, multi-instrument calibration workflows empower users to achieve high accuracy results across diverse setups with minimal user intervention.
- Built-in system calibration verification instills confidence in measurement accuracy before data collection begins.
- Comprehensive small-signal, large-signal, and pulsed testing captures real-world device behavior for reliable design and modeling.
- Powerful visualization and analytics suite empowers users to quickly interpret results, extract models, and drive faster design decisions.
Key Applications
- Transistor characterization
- Model validation and refinement
- Amplifier design
- Behavioral model extraction
- Stability and ruggedness testing
Resources
Data Sheet
InsightPro Measurement and Modeling Device Characterization Software
Application Notes
Maury Application Notes Library
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Models Table
Name | Description | Prerequisite |
---|---|---|
IP-IMP-ACT | Active impedance control |
– |
IP-IMP-BB | Baseband impedance control |
– |
IP-IMP-PAS | Passive impedance control |
– |
IP-IMP-WID | Wideband impedance control |
– |
IP-MDL-BM | Behavioral model extraction |
– |
IP-MEA-MOD | Modulated signal measurements |
– |
IP-MEA-NF | Noise figure measurements |
– |
IP-MEA-PIV | Pulsed IV measurements |
– |
IP-MEA-POW | Power / large signal measurements |
– |
IP-MEA-SPA | S-Parameters measurements or small-signal measurements |
– |
IP-MEA-TD | Time domain analysis / nonlinear measurements |
– |
IP-VIS | Data visualization and analysis |
– |