Insight Series
Insight is the industry’s first commercial software suite designed to empower VNA users and help them make better decisions. Insight represents a paradigm shift in the way users’ approach VNA calibration, validation, measurement, visualization and analysis. With VNA’s spanning multiple generations each with different interfaces, terminologies and capabilities as well as being used interchangeably in the lab, Insight offers an efficient way to consolidate everything into one simple-to-use platform. From calibrating and validating VNA cals to measurement, uncertainties and data analysis, Insight is an essential tool for any lab looking to improve the quality and efficiency of their measurements.
Insight makes use of Swiss Federal Institute of Metrology (METAS) VNA Tools Real Time Interface (RTI) and its evaluation of measurement uncertainty in accordance with the guidance provided by the GUM documents and the EURAMET VNA calibration guide.





Features & Benefits
- Define mechanical calibration standards from any vendor and use with all VNAs
- Avoid common errors with a simplified calibration process empowered by an intuitive GUI and wizard
- Validate VNA calibration using airlines and individually characterized verification kits
- Understand measurement results better with advanced visualization and analysis tools
- Identify and quantify the individual contributions of uncertainty
- Display uncertainty boundaries alongside measurement results
Filters
Name | Prerequisite |
---|---|
MT940A | – |
MT940B | MT940A |
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- VNA Calibration
- VNA Calibration Validation
- S-Parameters Measurements
- S-Parameters Measurements with Uncertainty
- Measurement Analysis
Related Products
Related Resources
01
Characterizing Uncertainty in S-Parameter Measurements
As technologies evolve and requirements become more challenging, implementing processes that increase confidence in measurements and ensure accurate and reliable characterization—and product performance—are critical. Learn how to characterize uncertainty with S-parameter measurements in this application note.