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MMW-STUDIO Series

MMW-STUDIO Series

MMW-STUDIO mmW and Sub-THz characterization software suite is designed to work with a 4-port VNA using waveguide extender modules and add accurate and repeatable high-resolution power control for direct measurement of vector corrected power and s-parameter measurements at the DUT reference plane. The load-pull software add-on combined with a Vector Modulation Unit (VMU), enables users to set arbitrary impedances, or perform active load pull measurements, where the magnitude of reflection presented to the DUT is achieved by controlling the ref a2 wave for maximum smith chart coverage. The industry’s first and only mmW and sub-THz software platform designed for large signal gain compression and active load pull measurements up to 1.1 THz!

Features & Benefits

  • Measure S-parameters at user-specified power level
  • High-resolution power control for accurate and repeatable vector-corrected 50Ω gain compression power sweep measurements
  • Arbitrary impedance control / active load pull
  • Measure fundamental powers (Pin, Pav, Pload), gain and efficiency at 50Ω and arbitrary impedances
  • Advanced measurement sequencer sweeps impedance, power, frequency and bias
  • Calibrated measurements at DUT reference plane
  • Supports most commercial waveguide extenders up to 1.1 THz

Filters

Prerequisite

Frequency Range (GHz)

Name PrerequisiteFrequency Range (GHz)
MT920A -
MT920B MT920A-
MT920C MT920A-
VMU201901 -8-18
  • Transistor characterization
  • Model extraction and validation
  • Amplifier circuit design
  • Robustness/ mismatch test of circuits and systems
  • Power, frequency and bias sweeps
Explore more

Related Resources

01

Frequency Scalable, Power Control and Active Tuning for Sub-THz Large-Signal Measurements

This poster provides a concise overview of important power measurement topics, including the detection of RF power, rise time and video bandwidth, and more. Ensure next-generation performance with this convenient visual guide for measuring RF power. 

02

Benchmarking a High Electron Mobility Transistor Using an Active Load-Pull System at 120 GHz–170 GHz

This study presents an in-depth investigation into the high-frequency capabilities of a commercial 100 nm InP high electron mobility transistor (HEMT) through small and large signal analysis.

03

Millimeter Wave and Sub-THz Power Sweep and Active Load-Pull Measurements

This article introduces the concept of active load pull and discusses the challenges related to performing gain compression power sweep and active load pull measurements on high-power devices at sub-THz frequencies.

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