AUTHORS: M. Spirito; M. P. van der Heijden; M. de Kok; L. C. N. de Vreede – Laboratory of Electronic Components, Technology & Materials, KIMES, Delft University of Technology, The Netherlands
PUBLICATION HISTORY: Reprinted with permission in November 2003 from the 61st ARFTG Conference Digest, Measurement Accuracy, Philadelphia, Pennsylvania; June 13, 2003.
ABSTRACT: This paper presents a calibration technique for on-wafer differential load-pull measurements. The described calibration procedure makes use of a standard GS/SG calibration substrate only. The calibration accuracy achieved is verified through various independent standard measurements.