ABSTRACT: This paper introduces a direct and accurate method for controlling and measuring the on-wafer device terminations at the base-band / envelope frequency, using an extension of a conventional network analyzer setup. The base-band impedance can be adjusted manually as well as electronically and is able to (over)_compensate the losses in the measurement setup. This facilitates on-wafer base-band terminations ranging from negative to high Ohmic values. The proposed measurement techniques are particularly useful when characterizing active devices for their linearity.
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