AUTHORS: L. Galatro, R. Romano and C. De Martino, Vertigo Technologies
PUBLICATION HISTORY: Microwave Journal – February 2020
ABSTRACT: Characterizing electronic devices and MMICs at sub-THz frequencies presents several challenges for the instrumentation. While S-parameter measurements can be performed using vector network analyzers (VNA) with mmWave extenders, large-signal measurements require dedicated measurement setups. A novel approach, described here, expands the capabilities of conventional VNA sub-THz S-parameter setups to achieve refined power control, power sweeps and active load-pull.