ABSTRACT: This demonstration shows the new Maury Pulsed IV measurement system that allows IV characterization from DC to Pulsed IV of 200ns. The setup supports gate sweeps from -30V to 30V up to 1.5A and drain sweeps from 0 to 280V up to 40A. A packaged GaN device will be used to test system capabilities up to 30V, while an external oscilloscope will be used to validate and showcase short-pulse performance.