AUTHORS: John Sevic, MSEE – Maury Microwave Corporation
PUBLICATION HISTORY: First published in February 2004.
ABSTRACT: A discussion of tuner-based RF device characterization and measurement. A rational for automated tuner-based measurement and automated tuner-based device characterization is given, followed by a discussion of the factors that drive the choice of tuner architecture. These factors include repeatability, impedance range, tuner speed, power capability, tuner resolution, bandwidth, and the size, level of integration, and ease of integration that are characteristics of various automated tuners. Detailed explanations of how tuners synthesize impedance, when and how tuner resolution is important, and why tuner repeatability is critical, are also given. System configuration examples are given and discussion of advanced capabilities of automated tuner-based measurements is included. A glossary of terms related to these subjects is provided.