ABSTRACT: Low-Earth orbit (LEO) satellite systems are being deployed for mission-critical use cases at an accelerating rate. This brings associated critical test requirements that, if not performed accurately, could lead to degraded system performance. This whitepaper will focus on how the technique of local oscillator (LO) substitution is used to evaluate or fault-find up and down conversion chains. For simplicity and brevity, ground station applications will be featured. However, the same technique applies to both user terminals and satellite payloads.
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