ABSTRACT: Maury Microwave device characterization solutions support on-wafer and connectorized passive, active, and hybrid-active load pull to 1.1 THz, as well as noise parameter extraction to 330 GHz for evaluating DUT noise performance. From specially designed hardware to advanced software platforms, Maury delivers end-to-end solutions supporting transistor characterization, behavior model extraction, and the design and validation of PAs and LNAs.
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