AUTHORS: Steve Dudkiewicz – Director, Device Characterization Business Development, Maury Microwave Corporation
PUBLICATION HISTORY: First published in the February 2011 issue of the Microwave Journal and republished in this form (with permission) in March 2011 by Maury Microwave Corporation.
ABSTRACT: Discusses the improvements in large-signal device characterization brought on by a new class of vector receiver load pull systems compared to older scalar techniques using calibrated automated load pull tuners.