AUTHORS: Steve Dudkiewicz, Eng. – Maury Microwave Corporation
PUBLICATION HISTORY: Originally presented by the author at a technical session of the 2nd International IEEE Conference on Microwaves, communications, Antennas and…
The HX2410 was originally a oversized black box on a Holzworth test bench. It was designed and used by Holzworth engineering to observe the true channel-to-channel phase coherency performance (relative ch-ch stability)…
AUTHORS: Gary Simpson – Maury Microwave Corporation
PUBLICATION HISTORY: First published in June 2009.
ABSTRACT: This application note provides step-by-step instructions for setting up a test bench for load…
AUTHORS: Gary Simpson – Maury Microwave Corporation
PUBLICATION HISTORY: First published in June 2009
ABSTRACT: This application note provides step-by-step instructions for setting up a test bench for ultra-fast…
AUTHORS: Maury Microwave Corporation – Engineering Department
PUBLICATION HISTORY: First published in July 2000.
ABSTRACT: A graph of tabular data correlating source match (dB) with peak-to-peak ripple (dB). A…
AUTHORS: John Sevic, MSEE – Maury Microwave Corporation November 2004
PUBLICATION HISTORY: First published in November 2004.
ABSTRACT: The source impedance presented at the DUT reference-plane by the source-tuner…
ABSTRACT: Gallium nitride (GaN) technology has become a staple for high power amplifiers (PAs) used in radar applications. Moreover, the high power and/or the radar application often require the signals…
ABSTRACT: This application note describes how the Boonton 55006 USB Peak Power Sensor can make fast and accurate time and statistical domain power measurements of Wi-Fi 802.11ac signals. This new…
AUTHORS: Maury Microwave Corporation – Engineering Department
PUBLICATION HISTORY: First published in July 1999.
ABSTRACT: A brief discussion of the basics of Intermodulation distortion measurements
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AUTHORS: Maury Microwave Corporation – Engineering Department
PUBLICATION HISTORY: First published in July 1999
ABSTRACT: A brief discussion of the basics of load and source pull measurements.
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AUTHORS: Maury Microwave Corporation – Engineering Department
PUBLICATION HISTORY: First published in July 1999
ABSTRACT: A brief discussion of the basics of noise measurements.
…
AUTHORS: Steve Dudkiewicz – Director, Device Characterization Business Development, Maury Microwave Corporation
PUBLICATION HISTORY: First published in the September 2010 issue of the Microwave Journal and republished in this form…