S-Parameters and VNA Calibration
Scattering parameters, or S-parameters, quantify how electrical signals propagate through a linear network. Comprising reflection and transmission coefficients, S-parameters reveal signal behavior at ports, aiding in circuit design and analysis. They define power flow, impedance matching, and signal integrity in high-frequency applications like microwave circuits.
Vector Network Analyzer (VNA) calibration is a process to enhance measurement accuracy by accounting for systematic errors in the test setup. Calibration involves applying known standards, like open, short, and load, to establish reference points, compensating for cables and connectors, ensuring accurate measurements of device characteristics such as S-parameters, and improving overall measurement reliability.
Learn more about Maury solutions for S-parameter measurements
S-Parameter Measurement Uncertainty
S-parameter measurement uncertainty refers to the potential errors or inaccuracies in the determination of scattering parameters (S-parameters) in a network. It encompasses factors like calibration uncertainties, environmental conditions, and equipment limitations. Understanding and quantifying these uncertainties are crucial for assessing the reliability and confidence in the measured S-parameter values, aiding accurate interpretation in fields such as RF and microwave engineering.
Through an expanded error model, the individual contributors to measurement uncertainty can be quantified and represented graphically as potential errors surrounding the measured S-parameters.
Explore More
Related Resources
01
Characterizing Uncertainty in S-Parameter Measurements
As technologies evolve and requirements become more challenging, implementing processes that increase confidence in measurements and ensure accurate and reliable characterization—and product performance—are critical. Learn how to characterize uncertainty with S-parameter measurements in this application note.
stay informed