Skip to content Skip to footer

A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy

AUTHORS: Maury Microwave, Vertigo Technologies and Virginia Diodes

PUBLICATION HISTORY: Microwave Journal – March 2024

ABSTRACT: The authors introduce the concept of active load pull, discuss the challenges related to performing gain compression power sweep and active load pull measurements on high-power devices at sub-THz frequencies, and then demonstrate a novel solution using high-power waveguide extender modules to overcome these challenges, compress the device under test, and extend load pull iso-contours to higher magnitudes of reflection.