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Behavioral Model Extraction

Introduction Extracting a compact transistor model requires several weeks of work, and potentially up to several months when starting from scratch. However, in some cases, the time needed to extract…

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EMC Immunity Testing

Introduction Maury Microwave has more than 60 years of experience in designing, manufacturing, and supporting turnkey measurements solutions. Our expertise includes base station and handset, radar, Wi-Fi, and FEM testing.…

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Noise Measurements

Noise and Noise Figure Noise occurs naturally in any active device or circuit, and limits the minimum levels of useful signals. With a cell phone, for example, it can interfere…

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S-parameter Measurements

S-Parameters and VNA Calibration Scattering parameters, or S-parameters, quantify how electrical signals propagate through a linear network. Comprising reflection and transmission coefficients, S-parameters reveal signal behavior at ports, aiding in…

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Scalar Load Pull

Introduction The term “load pull” consists of varying or “pulling” the load impedance seen by a device-under-test (DUT) while measuring the performance of the DUT. Similarly, “source pull” is Involves…

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Stability and Ruggedness Testing

Introduction Amplifier stability refers to the ability of an amplifier circuit to maintain its desired performance characteristics over time and under varying operating conditions. It is critical to ensure that…

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Vector Receiver Load Pull

Introduction Vector-receiver load pull is a modern and efficient methodology for load pull measurements. Vector-receiver load pull uses the same automated impedance tuners to tune the impedance presented to the…

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Wideband Modulated Load Pull

Introduction When working with modulated signals, i.e. for 4G, 5G and WLAN applications, for a well controlled linearity behavior of the DUT, the reflection coefficients offered to the DUT should…

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