Explore advanced solutions for load pull, pulsed IV, satellite link emulation, VNA calibration, EMC immunity, counter-UAS testing, and real-time RF power measurement at Booth B30, ExCel London.
What does it take to accurately characterize and test the RF technologies being developed today?
Today’s RF and microwave technologies present increasingly complex test challenges, including controlling impedance across wide modulation bandwidths, extending device characterization into D-band, recreating real-world satellite link impairments, improving VNA calibration, and generating and measuring high-power RF signals.
At European Microwave Week (EuMW) 2026, Maury Microwave will bring these challenges to the bench with live demonstrations and solutions spanning device characterization, communications, calibration, EMC, and high-power RF.
Experience it all firsthand at Booth #B30 during the exhibition October 6 – 8, 2026, in London.
Maury Technologies in Action at EuMW 2026
We’re bringing the best-in-class solutions off the spec sheet and onto the bench at EuMW 2026. Here’s a closer look at what will be demonstrated at the Maury booth.
Higher Reliability RF Power: Solid-State Alternatives to Traveling Wave Tubes
See how solid-state RF power can provide a reliable alternative to traveling wave tube amplifiers. Maury CW and pulsed amplifier portfolio supports demanding EMC, EW, radar, and component test applications with broad frequency coverage, high output power, and customizable configurations.
From Device Characterization to PA Optimization: InsightProTM for Advanced Load Pull
The demonstration combines vector-receiver load pull, automated source and load tuners, and Maury InsightPro software to control fundamental and harmonic impedances while measuring the incident and reflected traveling waves, commonly identified as a-waves and b-waves, at the DUT input and output.
Automated source and load Nano tuners, combined with Maury InsightPro software, enable characterization of power gain, output power, PAE, and input/output impedances for deeper insight into nonlinear device behavior. See how measured nonlinear behavior can be used to validate transistor models and optimize PA matching networks before committing to a hardware design.
Improving Model Accuracy with Advanced Pulsed IV
Self-heating and trapping effects can make it difficult to accurately characterize the intrinsic behavior of semiconductor devices. The Maury Pulsed IV system enables short-pulse measurements down to 200 ns to minimize self-heating and capture dynamic device behavior, supporting more accurate characterization and modeling.
Featured Maury Products
Enabling Next-Generation 5G/6G PA Design with Double RF Pulse & Wideband Load Pull
The MT2000 combines high-speed active load pull with a CW signal and the wideband impedance control up to 2GHz bandwidth for advanced device characterization in a single box. The New feature of Double RF-Pulse characterizes GaN devices with a controlled Charge trapping states for a realistic behavior of the DUT and the best insight of the performances of the PA to be designed.
Accelerating D-Band Component Development with VRLP Active Load Pull
Extending load-pull characterization into D-band requires precise impedance control and measurement confidence at increasingly challenging frequencies. The setup combines WR6.5 frequency-extension hardware, a Nano-series automated impedance tuner, vector-receiver measurement capability, and InsightPro software to support S-parameter measurement and active or hybrid-active load-pull characterization across 110–170 GHz.
Featured Maury Products
Validating 5G NTN Performance Through Realistic Satellite Link Emulation
Changing noise conditions can degrade SNR and impact signal quality across satellite communication links. The ACE9000 dynamically applies AWGN to a modulated QAM signal to emulate changing link conditions, providing a real-time view of how SNR variation impacts signal quality and constellation performance in 5G NTN and satellite applications.
Accelerating VNA Calibration and Improving Measurement Integrity
How confident are you in the accuracy and reliability of your VNA measurements? Maury uCal and Insight software streamline VNA calibration while maintaining high levels of accuracy, with integrated validation and uncertainty analysis providing clear visibility into calibration quality. By quantifying measurement uncertainty and identifying individual uncertainty contributions, Insight helps users better understand the confidence bounds of their measurement results.
Featured Maury Products
Electronic Warfare and Counter-UAS Testing with Broadband Noise Generation
Developing and testing counter-UAS technologies requires reliable, high-performance RF and microwave solutions. Maury will showcase programmable noise generators, broadband noise sources, and solid-state power amplifiers that support electronic countermeasure development, including RF link-denial, GNSS-interference, and high-power microwave applications.
End-to-End RF Solutions for EMC Immunity Testing
EMC immunity testing requires the power needed to achieve required field strengths while maintaining signal integrity and accurately verifying signal power. This setup combines the SGX1000 signal generator, MPA-series solid-state GaN amplifier, LLC series coupler, PMX40 power meter, and StabilityPlus phase-stable cable assemblies to support precise and reliable EMC immunity testing.
Featured Maury Products
See It All at EuMW 2026
Visit Maury Microwave at EuMW 2026 to see these technologies and more in action. Explore our complete lineup of live demonstrations and featured solutions, and schedule a meeting with our team to discuss your specific test and measurement challenges.
Plan Your Visit to Booth B30!
See everything Maury is bringing to EuMW 2026 and schedule time with our team.