Skip to content Skip to footer

Component Testing

From the first test to final specs, characterize components with clarity

Characterizing modern RF and microwave components demands high-performance measurements, real-world stress-testing, and tools that adapt across design, validation, and production workflows.

From transistor modeling to amplifier linearity assessment, Maury delivers the measurement solutions and expertise needed to uncover and analyze true component behavior. 

Maury solutions support:

  • Accurate device characterization: Delve deep into transistor performance with load pull, noise parameters, and S-parameter measurements.
  • Optimize signal amplification: Power measurement solutions analyze and validate amplifier performance, while T&M driver amplifiers ensure high-integrity DUT testing.
  • Signal generation: Test the behavior of local oscillators (LOs) and a component’s resilience to interference with RF signal and noise generators. 

Design, measure, and validate your boldest component designs with the utmost clarity and control—that’s what Maury solutions empower.

Model, optimize, and validate transistor performance

Accurate device characterization is fundamental to component success. From advanced load pull technologies and techniques to noise parameters extraction to S-parameter measurements for circuit design and analysis, Maury enables comprehensive transistor modeling, performance optimization, and validation. 

Assessing amplifier linearity and driving high-performance DUT analysis

Highly accurate power measurements are critical to understand amplifier performance and behavior. Maury peak power meters and USB power sensors deliver essential crest factor measurements and complementary cumulative distribution function (CCDF) statistical analysis to test power amplifiers for R&D, quality, manufacturing, field support, and system calibration applications.

Amplifiers themselves generate high-power RF signals needed to drive the test and measurement of high-performance DUTs, without introducing distortion or compromising measurement fidelity. Test confidently with Maury T&M amplifiers, which provide the wideband, linear, high-power output needed for modern test setups.

Evaluating local oscillator behavior and system resilience to complex interference

Critical components in uplink and downlink chains, LOs often introduce distortions that significantly impede performance. High-performance, stable, and spectrally pure signal generators are ideal LO substitutes to identify if an LO is the cause of system faults and failures. 

With Maury additive white Gaussian noise (AWGN) sources, component behavior is analyzed under real-world interreference conditions, ensuring thorough and consistent stress-testing for optimal performance after deployment.

High-integrity component testing throughout the entire signal chain

Maury’s comprehensive interconnects integrate seamlessly with any test setup, ensuring each part of your signal chain delivers the highest integrity and reliability throughout the testing process. With Maury, you’ll achieve accuracy and precision with every measurement.

Explore more

Related Resources

01

A Practical Guide to Load Pull Measurements

From fundamental concepts to advanced techniques, learn how load pull optimizes the performance of RF/microwave systems in this comprehensive eBook.

02

Understanding Phase Noise Measurements Poster

The poster, “Understanding Phase Noise Measurements,” provides a clear and concise overview of key phase noise concepts, including its impact on system performance, measurement techniques, cross correlation, confidence factor vs. noise floor, and advanced analysis solutions.

03

Understanding the Basics of RF Signal Generation

This white paper will provide an overview of the basic construction of an RF signal generator and the associated figures of merit.

stay informed

Latest News & Blogs

Ready to accelerate design cycles and enhance your product's performance?

Request a Demo